Timothy D. Sullivan
Popular items by Timothy D. Sullivan
View all offers-
Reliability Wearout Mechanisms in Advanced CMOS Technologies (IEEE Press Series on Microelectronic Systems)
Strong, Alvin W.; Wu, Ernest Y.; Vollertsen, Rolf-Peter; Sune, Jordi; La Rosa, Giuseppe; Sullivan, Timothy D.; Rauch...
Item prices starting from
View 23 offers£ 110.73
