Yield Modelling and Defect Tolerance in VLSI, Papers Presented at the INT Workshop on Designing for Yield, 1-3 July 1987, Oxford

Moore, Will; Maly, Wojciech

ISBN 10: 085274398X ISBN 13: 9780852743980
Published by CRC Press, 1988
Language: English
Condition: Used - Good Hardcover

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