X Ray Characterization of Materials

Lifshin, E.

ISBN 10: 3527296573 / ISBN 13: 9783527296576

Published by Wiley Vch, 1999

This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. Clean from markings. In fair condition, suitable as a study copy. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,800grams, ISBN:9783527296576. Seller Inventory # 9732691

Synopsis:

This reference work on methods in materials characterization covers developments of the different X-ray analysis techniques as well as the fundamentals of X-ray characterization.

From the Back Cover: X-ray Characterization of Materials Edited by Eric Lifshin Since modern materials such as high-temperature alloys, engineering thermoplastics and multilayer semiconductor films have many elemental constituents distributed in more than one phase, characterization is essential to the systematic development of such new materials and understanding how they behave in practical applications. X-ray techniques play a major role in providing information on the elemental composition and crystal and grain structures of all types of materials. The challenge to the materials scientist, chemist, or engineer is to know what information is needed to fully characterize each material and how to use this information to explain its behavior, develop new and improved properties, reduce costs, etc. This comprehensive handbook presents all the necessary background to understand the applications of X-ray analysis to materials characterization with particular attention to the modern approach to these methods.

Bibliographic Details

Title: X Ray Characterization of Materials
Publisher: Wiley Vch
Publication Date: 1999
Binding: Hardcover
Condition: Fair