X-ray Microscopy and Spectromicroscopy : Status Report from the Fifth International Conference, Würzburg, August 19-23, 1996

Thieme, Jürgen (EDT); Schmahl, Günter (EDT); Rudolph, Dietbert (EDT); Umbach, Eberhard (EDT)

ISBN 10: 3642721087 ISBN 13: 9783642721083
Published by Springer, 2014
Language: English
Condition: Used - As new Soft cover

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