X-ray Microscopy and Spectromicroscopy: Status Report from the Fifth International Conference, Würzburg, August 19-23, 1996

Thieme, Jürgen (Editor)/ Schmahl, Günter (Editor)/ Rudolph, Dietbert (Editor)/ Umbach, Eberhard (Editor)

ISBN 10: 3642721087 ISBN 13: 9783642721083
Published by Springer Verlag, 2014
Language: English
Condition: New Soft cover

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