Topics in Electron Diffraction and Microscopy of Materials

Language: English

Published by Taylor & Francis Ltd Jan 1999, 1999

075030538X / 9780750305389

Series: Book 1 of 5 - Series in Microscopy in Materials Science

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Seller: AHA-BUCH GmbH, Einbeck, GermanyAHA-BUCH GmbH

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Neuware - Topics in Electron Diffraction and Microscopy of Materials celebrates the retirement of Professor Michael Whelan from the University of Oxford. Professor Whelan taught many of today's heads of department and was a pioneer in the development and use of electron microscopy. His collaborators and colleagues, each one of whom has made important advances in the use of microscopy to study materials, have contributed to this cohesive work.The book provides a useful overview of current applications for selected electron microscope techniques that have become important and widespread in their use for furthering our understanding of how materials behave. Linked through the dynamical theory of electron diffraction and inelastic scattering, the topics discussed include the history and impact of electron microscopy in materials science, weak-beam techniques for problem solving, defect structures and dislocation interactions, using beam diffraction patterns to look at defects in structures, obtaining chemical identification at atomic resolution, theoretical developments in backscattering channeling patterns, new ways to look at atomic bonds, using numerical simulations to look at electronic structure of crystals, RHEED observations for MBE growth, and atomic level imaging applications.

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Title
Topics in Electron Diffraction and Microscopy of Materials
Author
Peter. B Hirsch
Publisher
Taylor & Francis Ltd Jan 1999
Publication year
1999
Condition
Neu
Binding
Buch
Language
English
ISBN 10
075030538X
ISBN 13
9780750305389
Item weight
476 grams
Dimensions
241x160x18 mm
Series
Book 1 of 5: Series in Microscopy in Materials Science

AHA-BUCH GmbH

Einbeck, Germany

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AbeBooks seller since August 14, 2006

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