Test Resource Partitioning for System-on-a-Chip

Language: English

Published by Springer, Springer Nov 2012, 2012

1461354005 / 9781461354000

Series: Book 27 of 40 - Frontiers in Electronic Testing

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This item is printed on demand - Print on Demand Titel. Neuware -Test Resource Partitioning for System-on-a-Chip is about test resource partitioning and optimization techniques for plug-and-play system-on-a-chip (SOC) test automation. Plug-and-play refers to the paradigm in which core-to-core interfaces as well as core-to-SOC logic interfaces are standardized, such that cores can be easily plugged into 'virtual sockets' on the SOC design, and core tests can be plugged into the SOC during test without substantial effort on the part of the system integrator. The goal of the book is to position test resource partitioning in the context of SOC test automation, as well as to generate interest and motivate research on this important topic.SOC integrated circuits composed of embedded cores are now commonplace. Nevertheless, There remain several roadblocks to rapid and efficient system integration. Test development is seen as a major bottleneck in SOC design, and test challenges are a major contributor to the widening gap between design capability and manufacturing capacity. Testing SOCs is especially challenging in the absence of standardized test structures, test automation tools, and test protocols.Test Resource Partitioning for System-on-a-Chip responds to a pressing need for a structured methodology for SOC test automation. It presents new techniques for the partitioning and optimization of the three major SOC test resources: test hardware, testing time and test data volume.Test Resource Partitioning for System-on-a-Chip paves the way for a powerful integrated framework to automate the test flow for a large number of cores in an SOC in a plug-and-play fashion. The framework presented allows the system integrator to reduce test cost and meet short time-to-market requirements.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 248 pp. Englisch.…

Seller Inventory # 9781461354000

Title
Test Resource Partitioning for System-on-a-Chip
Author
Vikram Iyengar
Publisher
Springer, Springer Nov 2012
Publication year
2012
Condition
Neu
Binding
Taschenbuch
Language
English
ISBN 10
1461354005
ISBN 13
9781461354000
Item weight
382 grams
Dimensions
235x155x14 mm
Series
Book 27 of 40: Frontiers in Electronic Testing

buchversandmimpf2000

Emtmannsberg, BAYE, Germany

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