Technology in Review Vol. II, Summer 1988: A Periodic Journal Published for the Technical Community of National Semiconductor

Language: English

Published by National Semiconductor Corporation, 1988

  • Softcover
  • Used
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Seller: Epilonian Books, Manhattan Beach, CA, U.S.A.Epilonian Books

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Softcover

Condition: Used - Very good

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Item description from seller

National Semiconductor Corporation, Published 1988. Wraps, 80 pp.; 28 cm; Vol. II, Summer 1988; illustrated with black-and-white circuit diagrams, schematics, charts, and graphs. In very good condition. Cream and brown paper covers with black and cream lettering on front and spine show mild shelf wear with light bumping and creasing to edges and mild soiling. Binding tight. Pages unmarked. A selection of papers delivered by the technical staff of National Semiconductor at electronics conferences including WESCON '87, ISSCC '88, IEDM '87, and the 1987 Microcontamination Conference and Exposition. Late-1980s Silicon Valley semiconductor engineering, from 16-bit microcontroller cores and bus standards to BiCMOS process technology, cleanroom alternatives, and IC packaging. Complete table of contents printed on front cover. Contents: Sixteen-Bit High-Performance Core Designed For ASIC; A Microcontroller-Based Smart Control Cell; A 33 Mbit/sec Data Synchronizing Phase-Locked-Loop Circuit; The NS32532: High Performance And Software Compatibility; A Comparison Of The Electrical Specifications Of Popular Bus Standards; Three-Dimensional Transient Simulation Of Electro-Thermal Behavior In Semiconductor Devices; Yield Diagnosis Through Interpretation Of Tester Data; Eliminating The Cleanroom: Experiences With An Open-Area SMIF Isolation Site (OASIS); Modeling The AC Impedance Of The Polysilicon-Silicon Interface; Modeling Of Delay And CrossTalk In Interconnects; A VLSI Poly Bipolar Process With 100-ps Gate Delay; An ECL Memory Cell With Separate Read And Write Ports; A High-Performance Bipolar ECL Standard Cell Library For Optimal Design Of High-Speed Bipolar LSI; Poly-Emitter Bipolar Hot-Carrier Effects In An Advanced BiCMOS Technology; A 12-ns 256K BiCMOS SRAM; A New Definition Of Package Thermal Measurement. …

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Bibliographic details

Title
Technology in Review Vol. II, Summer 1988: A Periodic Journal Published for the Technical Community of National Semiconductor
Author
Jon Rant [Editor]
Publisher
National Semiconductor Corporation
Publication year
1988
Condition
Very Good
Binding
Wrappers
Language
English
Dimensions
28 cm
Seller catalogs
General Non-Fiction

Epilonian Books

Manhattan Beach, CA, U.S.A.

5-star seller

AbeBooks seller since December 14, 2006

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