Technical Reliability Studies: EOS/ESD Technology Abstracts, Summer 1982

Published by Reliability Analysis Center, 1982

  • Softcover
  • Used
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Seller: Crossroad Books, Eau Claire, WI, U.S.A.Crossroad Books

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AbeBooks seller since August 22, 1998

Softcover

Condition: Used

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Item description from seller

Softcover. Ex-Corporate Library copy; with typical markings. Library label on front cover and on spine tail. Covers sunned. Light bumping on front cover corners. Small tear on bottom cover edge. Pages clean, but for library markings. ; TET22A; 11 x 8.25"; 287 pages; Ex-Library.

Seller Inventory # 57186

Bibliographic details

Title
Technical Reliability Studies: EOS/ESD Technology Abstracts, Summer 1982
Author
Denson, William K. ; & John P. Farrell
Publisher
Reliability Analysis Center
Publication year
1982
Condition
with no dust jacket
Dust jacket
No Dust Jacket
Binding
Softcover

Crossroad Books

Eau Claire, WI, U.S.A.

5-star seller

AbeBooks seller since August 22, 1998

Shipping rates within U.S.A.

Item5 to 14 business days3 to 6 business days
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Specialty

Science / Technical, Military History, American History / Americana, Wisconsin Regional, Transportation

Seller's business information

Crossroad Books

WI, U.S.A.