System-On-a-Chip Verification: Methodology and Techniques is the first book to cover verification strategies and methodologies for SOC verification from system level verification to the design sign- off. The topics covered include Introduction to the SOC design and verification aspects, System level verification in brief, Block level verification, Analog/mixed signal simulation, Simulation, HW/SW Co-verification, Static netlist verification, Physical verification, and Design sign-off in brief. All the verification aspects are illustrated with a single reference design for Bluetooth application.
System-On-a-Chip Verification: Methodology and Techniques takes a systematic approach that covers the following aspects of verification strategy in each chapter:

Explanation of the objective involved in performing verification after a given design step;
Features of options available;
When to use a particular option;
How to select an option; and
Limitations of the option.

This exciting new book will be of interest to all designers and test professionals.

Synopsis

"System-On-a-Chip Verification: Methodology and Techniques" is the first book to cover verification strategies and methodologies for SOC verification from system level verification to the design sign-off. The topics covered include: Introduction to the SOC design and verification aspects; System level verification in brief; Block level verification; Analog/mixed signal simulation; Simulation; HW/SW Co-verification; Static netlist verification; Physical verification; and, Design sign-off in brief.All the verification aspects are illustrated with a single reference design for Bluetooth application. "System-On-a-Chip Verification: Methodology and Techniques" takes a systematic approach that covers the following aspects of verification strategy in each chapter: explanation of the objective involved in performing verification after a given design step; features of options available; when to use a particular option; how to select an option; and limitations of the option. This exciting new book will be of interest to all designers and test professionals.

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