Structural, Syntactic, and Statistical Pattern Recognition : Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006, Proceedings

Dit-Yan Yeung

ISBN 10: 3540372369 ISBN 13: 9783540372363
Published by Springer, Berlin, Springer, 2006
Language: English
Condition: New Soft cover

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