Structural, Syntactic, and Statistical Pattern Recognition : Joint Iapr International Workshop, S+sspr 2016, Mérida, Mexico, November 29 - December 2, 2016, Proceedings

Robles-kelly, Antonio (EDT); Loog, Marco (EDT); Biggio, Battista (EDT); Escolano, Francisco (EDT); Wilson, Richard (EDT)

ISBN 10: 3319490540 ISBN 13: 9783319490540
Published by Springer, 2016
Language: English
Condition: New Soft cover

Sold by GreatBookPricesUK, Woodford Green, United Kingdom

AbeBooks Seller since 28 January 2020

Seller rating 5 out of 5 stars 5-star rating, Learn more about seller ratings

View this seller's items


New - Soft cover

Condition: New

Price: £ 49.12 Convert Currency
Free shipping within United Kingdom Destination, rates & speeds

Quantity: Over 20 available

Add to basket