Structural, Syntactic, and Statistical Pattern Recognition : Joint Iapr International Workshop, S+sspr 2014, Joensuu, Finland, August 20-22, 2014, Proceedings

Fränti, Pasi (EDT); Brown, Gavin (EDT); Loog, Marco (EDT); Escolano, Francisco (EDT); Pelillo, Marcello (EDT)

ISBN 10: 3662444143 ISBN 13: 9783662444146
Published by Springer, 2014
Language: English
Condition: Used - As new Soft cover

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