Structural, Syntactic, and Statistical Pattern Recognition : Joint Iapr International Workshop, S+sspr 2018, Beijing, China, August 17?19, 2018, Proceedings

Bai, Xiao (EDT); Hancock, Edwin R. (EDT); Ho, Tin Kam (EDT); Wilson, Richard C. (EDT); Biggio, Battista (EDT)

ISBN 10: 3319977849 ISBN 13: 9783319977843
Published by Springer, 2018
Language: English
Condition: New Soft cover

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