Structural, Syntactic, And Statistical Pattern Recognition : Joint Iapr International Workshops, Sspr 2006 And Spr 2006, Hong Kong, China, August 17-19, 2006, Proceedings

Yeung, Dit-Yan (EDT); Kwok, James T. (EDT); Fred, Ana (EDT); Roli, Fabio (EDT); De Ridder, Dick (EDT)

ISBN 10: 3540372369 ISBN 13: 9783540372363
Published by Springer, 2006
Language: English
Condition: New Soft cover

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