Structural, Syntactic, And Statistical Pattern Recognition: Joint Iapr International Workshops, Sspr 2006 And Spr 2006, Hong Kong, China, August 17-19, 2006, Proceedings

Yeung, Dit-Yan (Editor)/ Kwok, James T. (Editor)/ Fred, Ana (Editor)/ Roli, Fabio (Editor)/ De Ridder, Dick (Editor)

ISBN 10: 3540372369 ISBN 13: 9783540372363
Published by Springer Verlag, 2006
Language: English
Condition: New Soft cover

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