Statistics And Computing Modern Applied Statistics With S-Plus, Second Edition

Venables, W. N.; Ripley, B. D.

ISBN 10: 0387982140 / ISBN 13: 9780387982144

Published by Springer, New York

About this Item

2nd Edition, 1998 corrected 2nd printing. Like New / Fine condition. The covers look great. The binding is tight. The interior pages are clean and unmarked. There is a small abrasion to the front flyleaf. USPS electronic tracking number issued free of charge.

Seller Inventory # 11450

Bibliographic Details

• Title: Statistics And Computing Modern Applied Statistics With S-Plus, Second Edition
• Publisher: Springer, New York
• Language: English
• ISBN 10: 0387982140
• ISBN 13: 9780387982144
• Binding: Hardcover
• Edition: 2nd Edition.
• Condition: As New
• Dust Jacket Condition: No Jacket
• Seller catalogs:
  • Engineering

About this title

Synopsis

S-PLUS is a powerful environment for the statistical and graphical analysis of data. It provides the tools to implement many statistical ideas which have been made possible by the widespread availability of workstations having good graphics and computational capabilities. This is a guide to using S-PLUS to perform statistical analyses. It provides both an introduction to the use of S-PLUS and a course in modern statistical methods. Throughout, the emphasis is on presenting practical problems and full analyses of real data sets. Many of the methods discussed are approaches to topics such as linear and non-linear regression models, robust and smooth regression methods, survival analysis, multivariate analysis, tree-based methods, time series, spatial statistics, and classification.

About the Author

Dr. VEANBLES is Head of Department and Senior Lecturer at the Department of Statistics, University of Adelaide, and has given many short courses on S-PLUS in Australia, Europe and the USA. Professor RIPLEY holds the Chair of Applied Statistics at the University of Oxford, and is the author of four other books on spatial statistics, simulation, pattern recognition and neural networks.