Statistical Regression with Measurement Error: Kendall's Library of Statistics 6

Cheng, Chi-Lun

ISBN 10: 047071106X / ISBN 13: 9780470711064

Published by John Wiley & Sons Inc, 1999

About this Item

1st edition. 282 pages. 9.30x6.20x0.90 inches. In Stock. This item is printed on demand.

Seller Inventory # __047071106X

Bibliographic Details

• Title: Statistical Regression with Measurement Error: Kendall's Library of Statistics 6
• Publisher: John Wiley & Sons Inc
• Publication Date: 1999
• Language: English
• ISBN 10: 047071106X
• ISBN 13: 9780470711064
• Binding: Hardcover
• Condition: Brand New
• Weight: 0.5 kilograms

About this title

Synopsis

Providing a general survey of the theory of measurement error models, including the functional, structural, and ultrastructural models, this book is written in the of the Kendall and Stuart Advanced Theory of Statistics set and, like that series, includes exercises at the end of the chapters. The goal is to emphasize the ideas and practical implications of the theory in a style that does not concentrate on the theorem-proof format.

About the Author

Chi-Lun Cheng and John W. Van Ness are the authors of Statistical Regression with Measurement Error: Kendall's Library of Statistics 6, published by Wiley.