Software Defect and Operational Profile Modeling

Language: English

Published by Springer US, 2012

1461375592 / 9781461375593

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also in: THE KLUWER INTERNATIONAL SERIES ON ASIAN STUDIES IN COMPUTER AND INFORMATION SCIENCE, Volume 1 Preface. 1. Introduction. 2. Empirical Regression Methods. 3. Dynamic Methods. 4. Capture-Recapture Methods. 5. Decomposition Me.

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Title
Software Defect and Operational Profile Modeling
Author
Kai-Yuan Cai
Publisher
Springer US
Publication year
2012
Condition
New
Binding
Kartoniert / Broschiert
Language
English
ISBN 10
1461375592
ISBN 13
9781461375593

moluna

Greven, Germany

5-star seller

AbeBooks seller since July 9, 2020

Shipping rates from Germany to U.S.A.

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