Soft Errors (Paperback)
Language: English
Published by Taylor & Francis Ltd, London, 2020
- Softcover
- New
Seller: Grand Eagle Retail, Bensenville, IL, U.S.A.Grand Eagle Retail
AbeBooks seller since October 12, 2005
Condition: New
£ 75.09
Quantity: 1 available
Add to basketItem description from seller
Paperback. Soft errors are a multifaceted issue at the crossroads of applied physics and engineering sciences. Soft errors are by nature multiscale and multiphysics problems that combine not only nuclear and semiconductor physics, material sciences, circuit design, and chip architecture and operation, but also cosmic-ray physics, natural radioactivity issues, particle detection, and related instrumentation.Soft Errors: From Particles to Circuits addresses the problem of soft errors in digital integrated circuits subjected to the terrestrial natural radiation environmentone of the most important primary limits for modern digital electronic reliability. Covering the fundamentals of soft errors as well as engineering considerations and technological aspects, this robust text:Discusses the basics of the natural radiation environment, particle interactions with matter, and soft-error mechanismsDetails instrumentation developments in the fields of environment characterization, particle detection, and real-time and accelerated testsDescribes the latest computational developments, modeling, and simulation strategies for the soft error-rate estimation in digital circuitsExplores trends for future technological nodes and emerging devicesSoft Errors: From Particles to Circuits presents the state of the art of this complex subject, providing comprehensive knowledge of the complete chain of the physics of soft errors. The book makes an ideal text for introductory graduate-level courses, offers academic researchers a specialized overview, and serves as a practical guide for semiconductor industry engineers or application engineers. This book addresses the problem of soft errors in digital integrated circuits subjected to the terrestrial natural radiation environment, providing comprehensive knowledge of the complete chain of the physics of soft errors. The text discusses particle interactions with matter, soft-error mechanisms, and instrumentation developments in environme Shipping may be from multiple locations in the US or from the UK, depending on stock availability.…
Seller Inventory # 9780367655990
- Title
- Soft Errors (Paperback)
- Author
- Daniela Munteanu
- Publisher
- Taylor & Francis Ltd, London
- Publication year
- 2020
- Condition
- new
- Binding
- Paperback
- Language
- English
- ISBN 10
- 0367655993
- ISBN 13
- 9780367655990
Soft errors are a multifaceted issue at the crossroads of applied physics and engineering sciences. Soft errors are by nature multiscale and multiphysics problems that combine not only nuclear and semiconductor physics, material sciences, circuit design, and chip architecture and operation, but also cosmic-ray physics, natural radioactivity issues, particle detection, and related instrumentation.
Soft Errors: From Particles to Circuits addresses the problem of soft errors in digital integrated circuits subjected to the terrestrial natural radiation environment―one of the most important primary limits for modern digital electronic reliability. Covering the fundamentals of soft errors as well as engineering considerations and technological aspects, this robust text:
- Discusses the basics of the natural radiation environment, particle interactions with matter, and soft-error mechanisms
- Details instrumentation developments in the fields of environment characterization, particle detection, and real-time and accelerated tests
- Describes the latest computational developments, modeling, and simulation strategies for the soft error-rate estimation in digital circuits
- Explores trends for future technological nodes and emerging devices
Soft Errors: From Particles to Circuits presents the state of the art of this complex subject, providing comprehensive knowledge of the complete chain of the physics of soft errors. The book makes an ideal text for introductory graduate-level courses, offers academic researchers a specialized overview, and serves as a practical guide for semiconductor industry engineers or application engineers.
"Synopsis" may belong to another edition of this title.
About the Author
Jean-Luc Autran is distinguished professor of physics and electrical engineering at Aix-Marseille University and honorary member of the University Institute of France (IUF). He is also deputy director of the Institute for Materials, Microelectronics, and Nanosciences of Provence (IM2NP, UMR CNRS 7334) and the principal investigator of the Altitude Single-event effects Test European Platform (ASTEP). He is the author or coauthor of more than 300 papers published in international journals and conferences, a senior member of the Institute of Electrical and Electronics Engineers (IEEE), and a fellow of the Société de l’Electricité, de l’Electronique et des Technologies de l’Information et de la Communication (SEE).
Daniela Munteanu is director of research at the National Center for Scientific Research (CNRS). She is a fellow researcher at the Institute for Materials, Microelectronics, and Nanoscience of Provence (IM2NP, UMR CNRS 7334) and has 15 years of experience in characterization, modeling, and simulation of semiconductor devices. Her current research interests include emerging complementary-metal-oxide-semiconductor (CMOS) devices, compact modeling, numerical simulation in the domains of nanoelectronics, and radiation effects on components and circuits. She is also the author or coauthor of more than 200 papers published in international journals and conferences, and has supervised 12 Ph.D theses.
"About the title" may belong to another edition of this title.
Grand Eagle Retail
Bensenville, IL, U.S.A.
AbeBooks seller since October 12, 2005
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