Signal Processing and Pattern Recognition in Nondestructive Evaluation of Materials. (NATO ASI Series, Series F: Computer and Systems Science, Vol. 44)

Chen, Chi-hau (ED.):

ISBN 10: 3540191003 / ISBN 13: 9783540191001

Published by Berlin, Heidelberg, New York, London, Paris, Tokyo: Springer,, 1988

About this Item

Proceedings of the NATO Advanced Research Workshop on Signal Processing and Pattern Recognition in Nondestructive Evaluation of Materials, held at the Manoir St-Castin, Lac Beauport, Québec Canada, August 19 - 22, 1987; former library bokk in very good condition, ehem. Bibl.expl., Rückensign. Bibl.stempel innen, ansonsten einwandfreier Zustand 3540191003 Mit offener Rechnung beliefern wir gerne Buchhandlungen, Bibliotheken, Antiquariate, Schulen, Galerien und Institutionen. Bei neuen uns noch unbekannten privaten Kunden erlauben wir uns die Bitte um Vorauskasse. Wir bitten um Ihr Verständnis. Sprache: Deutsch Gewicht in Gramm: 800 8°, Hardcover-binding, geb. in Original-Pappband, VIII, 344 pp. : Ill., graph. Darst. , 25 cm.

Seller Inventory # 2301

Bibliographic Details

• Title: Signal Processing and Pattern Recognition in Nondestructive Evaluation of Materials. (NATO ASI Series, Series F: Computer and Systems Science, Vol. 44)
• Publisher: Berlin, Heidelberg, New York, London, Paris, Tokyo: Springer,
• Publication Date: 1988
• Language: German
• ISBN 10: 3540191003
• ISBN 13: 9783540191001
• Binding: Hardcover
• Seller catalogs:
  • Informatik

About this title

Synopsis

The NATO Advanced Research Workshop on Signal Processing and Pattern Recognition in Nondestructive Evaluation (NOE) of Materials was held August 19-22, 1987 at the Manoir St-Castin, Lac Beauport, Quebec, Canada. Modern signal processing, pattern recognition and artificial intelligence have been playing an increasingly important role in improving nondestructive evaluation and testing techniques. The cross fertilization of the two major areas can lead to major advances in NOE as well as presenting a new research area in signal processing. With this in mind, the Workshop provided a good review of progress and comparison of potential techniques, as well as constructive discussions and suggestions for effective use of modern signal processing to improve flaw detection, classification and prediction, as well as material characterization. This Proceedings volume includes most presentations given at the Workshop. This publication, like the meeting itself, is unique in the sense that it provides extensive interactions among the interrelated areas of NOE. The book starts with research advances on inverse problems and then covers different aspects of digital waveform processing in NOE and eddy current signal analysis. These are followed by four papers of pattern recognition and AI in NOE, and five papers of image processing and reconstruction in NOE. The last two papers deal with parameter estimation problems. Though the list of papers is not extensive, as the field of NOE signal processing is very new, the book has an excellent collection of both tutorial and research papers in this exciting new field.