Semiconductor Measurement Technology : A Versatile High - Voltage Bias Supply for Extended Range MIS C(V) and G(V) Measurments.

Kuczer, Paul, Harvey O. Hook and Alvin M. Goodman.

Published by NBS Special Publication 400-41, 1977, 62 Pp., 1977
Condition: Used - Very good Soft cover

Sold by Eryops Books, Stephenville, TX, U.S.A.

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Used - Soft cover

Condition: Used - Very good

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