Semiconductor Measurement Technology : Improved Infrared Response Technique for Detecting Defects and Impurities in Germanium and Silicon p-i-n Diodes (NBS Special Publication 400-13).

Sher, A. H. and the Electronic Technology Division, Institute for Applied Technology, National Bureau of Standards.

Published by National Bureau of Standards., 1975
Condition: Used - Very good Soft cover

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Used - Soft cover

Condition: Used - Very good

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