Scanning Nonlinear Dielectric Microscopy

Language: English

Published by Elsevier Science & Technology, Woodhead Publishing, 2020

0128172460 / 9780128172469

Series: Book 135 of 203 - Woodhead Publishing Series in Electronic and Optical Materials

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Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermanyBuchWeltWeit Ludwig Meier e.K.

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Item description from seller

This item is printed on demand - it takes 3-4 days longer - Neuware -Scanning Nonlinear Dielectric Microscopy: Investigation of Ferroelectric, Dielectric, and Semiconductor Materials and Devices is the definitive reference on an important tool to characterize ferroelectric, dielectric and semiconductor materials. Written by the inventor, the book reviews the methods for applying the technique to key materials applications, including the measurement of ferroelectric materials at the atomic scale and the visualization and measurement of semiconductor materials and devices at a high level of sensitivity. Finally, the book reviews new insights this technique has given to material and device physics in ferroelectric and semiconductor materials. The book is appropriate for those involved in the development of ferroelectric, dielectric and semiconductor materials devices in academia and industry. Englisch.

Seller Inventory # 9780128172469

Title
Scanning Nonlinear Dielectric Microscopy
Author
Yasuo Cho
Publisher
Elsevier Science & Technology, Woodhead Publishing
Publication year
2020
Condition
Neu
Binding
Taschenbuch
Language
English
ISBN 10
0128172460
ISBN 13
9780128172469
Item weight
420 grams
Dimensions
229x152x12 mm
Series
Book 135 of 203: Woodhead Publishing Series in Electronic and Optical Materials

BuchWeltWeit Ludwig Meier e.K.

Bergisch Gladbach, Germany

5-star seller

AbeBooks seller since January 11, 2012

Shipping rates from Germany to U.S.A.

Item5 to 15 business days5 to 15 business days
First item£ 19.77£ 19.77
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BuchWeltWeit Ludwig Meier e.K.

Germany