Scanning Nonlinear Dielectric Microscopy: Investigation of Ferroelectric, Dielectric, and Semiconductor Materials and Devices

Language: English

Published by Elsevier Science, 2020

0128172460 / 9780128172469

Series: Book 135 of 203 - Woodhead Publishing Series in Electronic and Optical Materials

  • Softcover
  • New
See all details

Seller: moluna, Greven, Germanymoluna

5-star seller

AbeBooks seller since July 9, 2020

View this seller's items
Softcover

Condition: New

£ 198.53

£ 42.10 shipping 
Ships from Germany to U.S.A.

Quantity: Over 20 available

Add to basket

Item description from seller

Presents an in-depth look at the SNDM materials characterization technique by its inventor Reviews key materials applications, such as measurement of ferroelectric materials at the nanoscale and measurement of semiconductor materials and d.

Seller Inventory # 336108498

Title
Scanning Nonlinear Dielectric Microscopy: Investigation of Ferroelectric, Dielectric, and Semiconductor Materials and Devices
Author
Yasuo Cho
Publisher
Elsevier Science
Publication year
2020
Condition
New
Binding
Soft cover
Language
English
ISBN 10
0128172460
ISBN 13
9780128172469
Series
Book 135 of 203: Woodhead Publishing Series in Electronic and Optical Materials

moluna

Greven, Germany

5-star seller

AbeBooks seller since July 9, 2020

Shipping rates from Germany to U.S.A.

Item26 to 60 business days26 to 60 business days
First item£ 42.10£ 42.10
Delivery times are set by sellers and vary by carrier and location. Orders passing through Customs may face delays and buyers are responsible for any associated duties or fees. Sellers may contact you regarding additional charges to cover any increased costs to ship your items.

Payment methods

  • Visa
  • Mastercard
  • American Express
  • Apple Pay
  • Google Pay
  • Bank Wire Transfer
  • Check
  • Paypal

Store description

Online Handel nur mit Neubüchern

Seller's business information

Moluna GmbH

Engberdingdamm 27
Greven, Germany 48268