Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition

Goldstein, Joseph; Newbury, Dale E.; Joy, David C.; Lyman, Charles E.; Echlin, Patrick; Lifshin, Eric; Sawyer, Linda; Michael, J.R.

ISBN 10: 0306472929 ISBN 13: 9780306472923
Published by Springer, 2003
Language: English
Condition: Used - Very good Hardcover

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Used - Hardcover

Condition: Used - Very good

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