Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition

Goldstein, Joseph; Newbury, Dale E.; Joy, David C.; Lyman, Charles E.; Echlin, Patrick; Lifshin, Eric; Sawyer, Linda; Michael, J.R.

ISBN 10: 1461349699 ISBN 13: 9781461349693
Published by Springer, 2013
Language: English
Condition: New Soft cover

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