Scanning Electron Microscopy and X-Ray Microanalysis

Joseph I. Goldstein|Dale E. Newbury|Joseph R. Michael|Nicholas W.M. Ritchie|John Henry J. Scott|David C. Joy

ISBN 10: 1493982699 ISBN 13: 9781493982691
Published by Springer New York, 2018
Language: English
Condition: New Soft cover

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New - Soft cover

Condition: New

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