Scanning Electron Microscopy and X-Ray Microanalysis

Joseph I. Goldstein|Dale E. Newbury|Joseph R. Michael|Nicholas W.M. Ritchie|John Henry J. Scott|David C. Joy

ISBN 10: 149396674X ISBN 13: 9781493966745
Published by Springer New York, 2017
Language: English
Condition: New Hardcover

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