Scanning Electron Microscopy and X-Ray Microanalysis

Goldstein, Joseph I.; Newbury, Dale E.; Michael, Joseph R.; Ritchie, Nicholas W.M.; Scott, John Henry J.; Joy, David C.

ISBN 10: 149396674X ISBN 13: 9781493966745
Published by Springer (edition Fourth Edition 2018), 2017
Language: English
Condition: Used - Fair Hardcover

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