Scanning Electron Microscopy and X-Ray Microanalysis

Goldstein, Joseph I.,Newbury, Dale E.,Michael, Joseph R.,Ritchie, Nicholas W.M.,Scott, John Henry J.,Joy, David C.

ISBN 10: 149396674X ISBN 13: 9781493966745
Published by Springer, 2017
Language: English
Condition: Used - Good Hardcover

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