Scanning Electron Microscopy and X-Ray Microanalysis

Goldstein, Joseph I.; Newbury, Dale E.; Michael, Joseph R.; Ritchie, Nicholas W.M.; Scott, John Henry J.; Joy, David C.

ISBN 10: 1493982699 ISBN 13: 9781493982691
Published by Springer, 2018
Language: English
Condition: New Soft cover

Sold by Majestic Books, Hounslow, United Kingdom

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New - Soft cover

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