SECONDARY ION MASS SPECTROMETRY SIMS XV. PROCEEDINGS OF THE FIFTEENTH INTERNATIONAL CONFERENCE ON SECONDARY ION MASS SPECTROMETRY, SIMS XV, THE UNIVERSITY OF MANCHESTER, UK. SEPTEMBER 12-16, 2005.

Vickerman, John C. and Ian S. Gilmore and Mark G. Dowsett and Alex Henderson, editors

Published by Elsevier, 2006
Condition: Used Hardcover

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