Research on the Radiation Effects and Compact Model of SiGe HBT

Language: English

Published by Springer, 2017

9811046115 / 9789811046117

Series: Book 361 of 797 - Springer Theses

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Nominated as an outstanding PhD dissertation by Tsinghua University, China Proposes a new technique for detecting displacement damage in silicon-germanium (SiGe) heterojunction bipolar transistors (HBTs) with swift heavy ions instead of neutrons Presents an improved, high-frequency, small-signal model for SiGe HBTs taking into account the distribution characteristics Sprache: Englisch Gewicht in Gramm: 407.

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Title
Research on the Radiation Effects and Compact Model of SiGe HBT
Author
Yabin Sun
Publisher
Springer
Publication year
2017
Condition
Neu
Binding
Gebundene Ausgabe
Language
English
ISBN 10
9811046115
ISBN 13
9789811046117
Item weight
407 grams
Series
Book 361 of 797: Springer Theses

Home-set

Mannheim, Germany

5-star seller

AbeBooks seller since April 13, 2026

Shipping rates from Germany to U.S.A.

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