Reliability Wearout Mechanisms in Advanced CMOS Technologies

Language: English

Published by John Wiley and Sons Ltd, 2009

0471731722 / 9780471731726

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This invaluable resource tells the complete story of failure mechanisms from basic concepts to the tools necessary to conduct reliability tests and analyze the results. Both a text and a reference work for this important area of semiconductor technology, it assumes no reliability education or experience. Series: IEEE Press Series on Microelectronic Systems. Num Pages: 624 pages, Illustrations. BIC Classification: TJFC; UY. Category: (P) Professional & Vocational. Dimension: 235 x 162 x 34. Weight in Grams: 982. . 2009. 1st Edition. Hardcover. . . . . Books ship from the US and Ireland.

Seller Inventory # V9780471731726

Title
Reliability Wearout Mechanisms in Advanced CMOS Technologies
Author
Alvin W. Strong
Publisher
John Wiley and Sons Ltd
Publication year
2009
Condition
New
Binding
Hardcover
Language
English
ISBN 10
0471731722
ISBN 13
9780471731726

Kennys Bookstore

Olney, MD, U.S.A.

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AbeBooks seller since October 9, 2009

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