Reliability Prediction from Burn-In Data Fit to Reliability Models

Language: English

Published by Elsevier Inc Mär 2014, 2014

0128007478 / 9780128007471

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Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermanyBuchWeltWeit Ludwig Meier e.K.

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Softcover

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This item is printed on demand - it takes 3-4 days longer - Neuware -This work will educate chip and system designers on a method for accurately predicting circuit and system reliability in order to estimate failures that will occur in the field as a function of operating conditions at the chip level. This book will combine the knowledge taught in many reliability publications and illustrate how to use the knowledge presented by the semiconductor manufacturing companies in combination with the HTOL end-of-life testing that is currently performed by the chip suppliers as part of their standard qualification procedure and make accurate reliability predictions. This book will allow chip designers to predict FIT and DPPM values as a function of operating conditions and chip temperature so that users ultimately will have control of reliability in their design so the reliability and performance will be considered concurrently with their design. 108 pp. Englisch.

Seller Inventory # 9780128007471

Title
Reliability Prediction from Burn-In Data Fit to Reliability Models
Author
Joseph Bernstein
Publisher
Elsevier Inc Mär 2014
Publication year
2014
Condition
Neu
Binding
Taschenbuch
Language
English
ISBN 10
0128007478
ISBN 13
9780128007471
Item weight
172 grams
Dimensions
228x151x10 mm

BuchWeltWeit Ludwig Meier e.K.

Bergisch Gladbach, Germany

5-star seller

AbeBooks seller since January 11, 2012

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BuchWeltWeit Ludwig Meier e.K.

Germany