Recent Developments in Atomic Force Microscopy and Raman Spectroscopy for Materials Characterization. This item is unavailable.
Language: English
Published by IntechOpen, 2022
- Hardcover
- New
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Seller: preigu, Osnabrück, Germanypreigu
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Recent Developments in Atomic Force Microscopy and Raman Spectroscopy for Materials Characterization | Chandra Shakher Pathak (u. a.) | Buch | Gebunden | Englisch | 2022 | IntechOpen | EAN 9781839682292 | Verantwortliche Person für die EU: preigu GmbH & Co. KG, Lengericher Landstr. 19, 49078 Osnabrück, mail[at]preigu[dot]de | Anbieter: preigu Print on Demand.
Seller Inventory # 121145061
- Title
- Recent Developments in Atomic Force Microscopy and Raman Spectroscopy for Materials Characterization
- Author
- Chandra Shakher Pathak (u. a.)
- Publisher
- IntechOpen
- Publication year
- 2022
- Condition
- Neu
- Binding
- Buch
- Language
- English
- ISBN 10
- 1839682299
- ISBN 13
- 9781839682292
- Item weight
- 807 grams
- Dimensions
- 266 x 185 x 23 mm
- Seller catalogs
- Bücher
This book contains chapters that describe advanced atomic force microscopy (AFM) modes and Raman spectroscopy. It also provides an in-depth understanding of advanced AFM modes and Raman spectroscopy for characterizing various materials. This volume is a useful resource for a wide range of readers, including scientists, engineers, graduate students, postdoctoral fellows, and scientific professionals working in specialized fields such as AFM, photovoltaics, 2D materials, carbon nanotubes, nanomaterials, and Raman spectroscopy.
"Synopsis" may belong to another edition of this title.