Radiation Induced Fault Detection, Diagnosis, and Characterization on FPGAs. This item is unavailable.
Language: English
Published by Legare Street Press Dez 2012, 2012
- Softcover
- New

Seller: AHA-BUCH GmbH, Einbeck, GermanyAHA-BUCH GmbH
AbeBooks seller since August 14, 2006
Condition: New
£ 26.96
Item description from seller
Neuware - The development of Field Programmable Gate Arrays (FPGAs) has been a great achievement in the world of microelectronics. One of these devices can be programmed to replace the need for thousands of individual specialized devices. Despite their great versatility, FPGAs are still extremely vulnerable to radiation from cosmic waves in space. Extensive research has been conducted to examine how radiation disrupts FPGAs. This research incorporates and enhances current methods of radiation detection. A design is created that has the ability to detect flipped bits and delay errors caused by radiation along with their location, amount and duration. All of this is accomplished and reported in real time. The design requires more testing, but once that is done this system can be incorporated with FPGA reconfiguration methods that automatically place application logic away from failing errors of the FPGA. This system has great potential to become a valuable tool in fault mitigation.This work has been selected by scholars as being culturally important, and is part of the knowledge base of civilization as we know it. This work was reproduced from the original artifact, and remains as true to the original work as possible. Therefore, you will see the original copyright references, library stamps (as most of these works have been housed in our most important libraries around the world), and other notations in the work.This work is in the public domain in the United States of America, and possibly other nations. Within the United States, you may freely copy and distribute this work, as no entity (individual or corporate) has a copyright on the body of the work.As a reproduction of a historical artifact, this work may contain missing or blurred pages, poor pictures, errant marks, etc. Scholars believe, and we concur, that this work is important enough to be preserved, reproduced, and made generally available to the public. We appreciate your support of the preservation process, and thank you for being an important part of keeping this knowledge alive and relevant.…
Seller Inventory # 9781288397495
- Title
- Radiation Induced Fault Detection, Diagnosis, and Characterization on FPGAs
- Author
- Thomas B. Getz
- Publisher
- Legare Street Press Dez 2012
- Publication year
- 2012
- Condition
- Neu
- Binding
- Taschenbuch
- Language
- English
- ISBN 10
- 1288397496
- ISBN 13
- 9781288397495
- Item weight
- 110 grams
- Dimensions
- 234x156x4 mm
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