Radiation Induced Fault Detection, Diagnosis, and Characterization on FPGAs

Language: English

Published by BIBLIOSCHOLAR, 2012

1288397496 / 9781288397495

  • Softcover
  • New
See all details

Seller: moluna, Greven, Germanymoluna

5-star seller

AbeBooks seller since July 9, 2020

Softcover

Condition: New

£ 20.09

£ 41.02 shipping 
Ships from Germany to U.S.A.

Quantity: Over 20 available

Add to basket
Free 30-day returns

Item description from seller

KlappentextrnrnThe development of Field Programmable Gate Arrays (FPGAs) has been a great achievement in the world of microelectronics. One of these devices can be programmed to replace the need for thousands of individual specialized devices. D.

Seller Inventory # 6560590

Title
Radiation Induced Fault Detection, Diagnosis, and Characterization on FPGAs
Author
Getz, Thomas B.
Publisher
BIBLIOSCHOLAR
Publication year
2012
Condition
New
Binding
Soft cover
Language
English
ISBN 10
1288397496
ISBN 13
9781288397495

moluna

Greven, Germany

5-star seller

AbeBooks seller since July 9, 2020

Shipping rates from Germany to U.S.A.

Item26 to 60 business days26 to 60 business days
First item£ 41.02£ 41.02
Delivery times are set by sellers and vary by carrier and location. Orders passing through Customs may face delays and buyers are responsible for any associated duties or fees. Sellers may contact you regarding additional charges to cover any increased costs to ship your items.

Payment methods

  • Visa
  • Mastercard
  • American Express
  • Apple Pay
  • Google Pay
  • Bank Wire Transfer
  • Check
  • Paypal

Store description

Online Handel nur mit Neubüchern

Seller's business information

Moluna GmbH

Engberdingdamm 27
Greven, Germany 48268