Radiation Effects And Soft Errors In Integrated Circuits And Electronic Devices. This item is unavailable.

Language: English

Published by World Scientific Publishing Co Pte Ltd, SG, 2004

9812389407 / 9789812389404

  • Hardcover
  • New
See all details

Seller: Rarewaves.com USA, London, London, United KingdomRarewaves.com USA

5-star seller

AbeBooks seller since June 11, 2025

View this seller's items
Unavailable
Hardcover

Condition: New

£ 184.15

This specific item is no longer available.

Item description from seller

This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative energy deposited by the radiation (total ionizing dose effects). Bipolar (Si and SiGe), metal-oxide-semiconductor (MOS), and compound semiconductor technologies are discussed. In addition to considering the specific issues associated with high-performance devices and technologies, the book includes the background material necessary for understanding radiation effects at a more general level.

Seller Inventory # LU-9789812389404

Title
Radiation Effects And Soft Errors In Integrated Circuits And Electronic Devices
Author
R D Schrimpf
Publisher
World Scientific Publishing Co Pte Ltd, SG
Publication year
2004
Condition
New
Binding
Hardback
Language
English
ISBN 10
9812389407
ISBN 13
9789812389404
Dimensions
15.24 x 2.06 x 22.86 cm

Search results for Radiation Effects And Soft Errors In Integrated Circuits And Electronic Devices

There are 2 more copies of this bookView all results