Quality Aspects in Spatial Data Mining

Stein, Alfred (Editor)/ Shi, Wenzhong (Editor)/ Bijker, Wietske (Editor)

ISBN 10: 0367386321 ISBN 13: 9780367386320
Published by CRC Pr I Llc, 2019
Language: English
Condition: New Soft cover

Sold by Revaluation Books, Exeter, United Kingdom

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