Quality Aspects in Spatial Data Mining

Stein, Alfred (EDT); Shi, Wenzhong (EDT); Bijker, Wietske (EDT)

ISBN 10: 0367386321 ISBN 13: 9780367386320
Published by Routledge, 2019
Language: English
Condition: Used - As new Soft cover

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Used - Soft cover

Condition: Used - As new

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