Progress in Pattern Recognition, Image Analysis, Computer Vision, and Applications : 16th Iberoamerican Congress on Pattern Recognition, Ciarp 2011, Pucón, Chile, November 15-18, 2011. Proceedings

San Martin, César (EDT); Kim, Sang-woon (EDT)

ISBN 10: 364225084X ISBN 13: 9783642250842
Published by Springer, 2011
Language: English
Condition: New Soft cover

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