Progress in Pattern Recognition, Image Analysis, Computer Vision, and Applications : 22nd Iberoamerican Congress, Ciarp 2017, Valparaíso, Chile, November 7?10, 2017, Proceedings

Mendoza, Marcelo (EDT); Velastín, Sergio (EDT)

ISBN 10: 3319751921 ISBN 13: 9783319751924
Published by Springer, 2018
Language: English
Condition: Used - As new Soft cover

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