Progress in Pattern Recognition, Image Analysis and Applications: 12th Iberoamerican Congress on Pattern Recognition, Ciarp 2007,valpariso, Chile, November 13-16, 2007, Proceedings

Rueda, Luis (Editor)/ Mery, Domingo (Editor)/ Kittler, Josef (Editor)

ISBN 10: 354076724X ISBN 13: 9783540767244
Published by Springer-Verlag New York Inc, 2008
Language: English
Condition: New Soft cover

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