Process-Induced Random Variation and Variation-Aware CMOS Device Designs

Language: English

Published by Springer Netherlands, 2016

9401775958 / 9789401775953

Series: Book 60 of 72 - Springer Series in Advanced Microelectronics

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Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Offers an insightful overview of the key techniques in variation-immune CMOS device designs Covers the main contemporary issues in CMOS device design, such as how to overcome process-induced random variations including line-edge-roughness, random.

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Title
Process-Induced Random Variation and Variation-Aware CMOS Device Designs
Author
Changhwan Shin
Publisher
Springer Netherlands
Publication year
2016
Condition
New
Binding
Gebunden
Language
English
ISBN 10
9401775958
ISBN 13
9789401775953
Series
Book 60 of 72: Springer Series in Advanced Microelectronics

moluna

Greven, Germany

5-star seller

AbeBooks seller since July 9, 2020

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