Power-Constrained Testing of VLSI Circuits: A Guide to the IEEE 1149.4 Test Standard (Frontiers in Electronic Testing, 22B)

Book 11 of 40: Frontiers in Electronic Testing

Nicolici, Nicola; Al-Hashimi, Bashir M.

ISBN 10: 1441953159 ISBN 13: 9781441953155
Published by Springer, 2010
Language: English
Condition: New Soft cover

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