Pmp®/Capm® Exam Prep : A Basic Guide to Activity-on-Node and Critical Path Method
Das Purkayastha, Jayanta K.
ISBN 10: 161434504X ISBN 13: 9781614345046
Published by Booklocker.com, Incorporated, 2011
Used
Soft cover
From
Better World Books, Mishawaka, IN, U.S.A.
Seller rating 5 out of 5 stars
AbeBooks Seller since 3 August 2006
This specific item is no longer available.
About this Item
Description:
Pages intact with minimal writing/highlighting. The binding may be loose and creased. Dust jackets/supplements are not included. Stock photo provided. Product includes identifying sticker. Better World Books: Buy Books. Do Good. Seller Inventory # 55778792-6
Synopsis:
A thorough and in-depth preparation guide for PMP® and CAPM® exams covering Precedence Diagramming Method/Activity-On-Node concepts and their analysis using Critical Path Method. This guide explains the concepts with illustrated examples with emphasis on special situations. Explanation of concepts through stepwise solved examples will provide readers hands-on ability for their application. This guide will serve as a launch pad for advanced study in this area beyond the requirements of the two exams.
"About this title" may belong to another edition of this title.
Bibliographic Details
Title: Pmp®/Capm® Exam Prep : A Basic Guide to ...
Publisher: Booklocker.com, Incorporated
Publication Date: 2011
Binding: Soft cover
Condition: Good