Physical Measurement and Analysis of Thin Films

Language: English

Published by Springer US, Springer US Dez 2013, 2013

1489959122 / 9781489959126

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Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermanyBuchWeltWeit Ludwig Meier e.K.

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Softcover

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This item is printed on demand - it takes 3-4 days longer - Neuware 208 pp. Englisch.

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Bibliographic details

Title
Physical Measurement and Analysis of Thin Films
Author
E. M. Murt
Publisher
Springer US, Springer US Dez 2013
Publication year
2013
Condition
Neu
Binding
Taschenbuch
Language
English
ISBN 10
1489959122
ISBN 13
9781489959126
Item weight
309 grams
Dimensions
229x152x12 mm

BuchWeltWeit Ludwig Meier e.K.

Bergisch Gladbach, Germany

5-star seller

AbeBooks seller since January 11, 2012

Shipping rates from Germany to U.S.A.

Item5 to 15 business days5 to 15 business days
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BuchWeltWeit Ludwig Meier e.K.

Germany