Photo-Excited Charge Collection Spectroscopy: Probing the traps in field-effect transistors (SpringerBriefs in Physics)

Book 33 of 151: SpringerBriefs in Physics

Im, Seongil, Chang, Youn-Gyoung, Kim, Jae Hoon

ISBN 10: 9400763913 ISBN 13: 9789400763913
Published by Springer, 2013
Language: English
Condition: Used - As new Soft cover

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